ascopubs.org

Cost-Effectiveness of Parallel Versus Sequential Testing of Genetic Aberrations for Stage IV Non–Small-Cell Lung Cancer in the Netherlands

Phase II Study of Afatinib in Patients With Tumors With Human Epidermal Growth Factor Receptor 2–Activating Mutations: Results From the National Cancer Institute–Molecular Analysis for Therapy Choice ...
Semiconductor Engineering

Coping With Parallel Test Site-to-Site Variation

Testing multiple devices in parallel using the same ATE results in reduced test time and lower costs, but it requires engineering finesse to make it so. Minimizing test measurement variation for each ...
Semiconductor Engineering

Promises and Perils of Parallel Test

Testing multiple devices at the same time is not providing the equivalent reduction in overall test time due to a combination of test execution issues, the complexity of the devices being tested, and ...
Business Wire

Keysight’s New Parallel Parametric Test System Delivers High Throughput and Cost-Effective Wafer Test

SANTA ROSA, Calif.--(BUSINESS WIRE)--Keysight Technologies, Inc. (NYSE: KEYS), a leading technology company that delivers advanced design and validation solutions to help accelerate innovation to ...
Seeking Alpha

Keysight Introduces Scalable, Modular, All-in-One Testing Solution to Accelerate High-Volume PCBA Manufacturing

Compact, modular system with integrated multi-test capability and up to 20-core parallel testing for high-volume efficiency Keysight i7090 Massively Parallel and Scalable Board Test System. This ...
Business Wire

Keithley Adds Support for Non-Volatile Memory, Very Low Frequency C-V, and Increased Parallel Testing to Semiconductor Parameter Analyzer

CLEVELAND--(BUSINESS WIRE)--Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has introduced a variety of enhancements for its award-winning Model ...